National Museums Scotland - SEM & Analytics Procurement

Tender description

This tender seeks to procure a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) and a range of analytical detectors to enable high-resolution imaging and analysis which can be used in concert to inform our understanding of a range of materials present in our collections (archaeological metallurgy, minerals, pigments, glass, enamels, organic materials etc). Lot 1: VARIABLE PRESSURE FIELD-EMISSION GUN SEM (VP FEG-SEM) Please see full specification in attached Schedule 3-Invitation to Tender. Additional information: Please see full details in attached Schedule 3 - Invitation to Tender. Lot 2: RGB/COLOUR CATHODOLUMINESCENCE DETECTOR (CL) Please see full details in attached Schedule 3 - Invitation to Tender. Additional information: Please see full details in attached Schedule 3 - Invitation to Tender. Lot 3: ENERGY-DISPERSIVE X-RAY MICROANALYSIS SYSTEM LOT 3: A) TRANSFER OF EXISTING ENERGY-DISPERSIVE X-RAY MICROANALYSIS SYSTEM & SOFTWARE UPGRADE; OR B) A NEW EDS SYSTEM; AS WELL AS A WAVELENGTH DISPERSIVE X-RAY SPECTROMETER (WDS) AND ELECTRON BACKSCATTER DIFFRACTION (EBSD) MICROANALYSIS SYSTEM. Please see attached Schedule 3-Invitation to Tender for full details. Additional information: Please see attached Schedule 3-Invitation to Tender for full details. Lot 4: FIELD EMISSION GUN A FIELD-EMISSION GUN SEM WITH VARIABLE PRESSURE WITH RGB/COLOUR CATHODOLUMINESCENCE DETECTOR (CL); AS WELL AS AN A) TRANSFER OF EXISTING ENERGY-DISPERSIVE X-RAY MICROANALYSIS SYSTEM & SOFTWARE UPGRADE OR B) A NEW EDS SYSTEM; WAVELENGTH DISPERSIVE X-RAY SPECTROMETER (WDS); AS WELL AS AN ELECTRON BACKSCATTER DIFFRACTION (EBSD) MICROANALYSIS SYSTEM. Please see attached Schedule 3-Invitation to Tender for full details. Additional information: Please see attached Schedule 3-Invitation to Tender for full details. Lot 5: FEG-SEM Equipment Including All Parts Please see Schedule 3- Invitation to Tender for full specification. Additional information: Please see Schedule 3- Invitation to Tender for full specification.