Scanning electron microscopes

Tender description

A high resolution field emission scanning electron microscope (SEM) equipped with a focused ion beam (FIB) for serial block face and section imaging of plastic embedded biological specimens. The instrument should meet the following specifications: • field emission electron source • accelerating voltage stable at very low kV (~1-1.5 kV) and adjustable up to 30 kV • SEM resolution ≤1.6 nm at 1 kV • detectors should be optimized for low kV imaging of biological specimens, and should include at least in-lens SE, in-lens BSE, in-chamber SE and retractable solid state BSE • large chamber with a load lock for fast specimen exchange • compatible for imaging of poorly conductive biological specimens • multi-axial motorized stage • cameras to assist navigation on the sample • integrated plasma cleaner • cold trap • focused ion beam column equipped with a long-lifetime stable gallium source capable to produce adjustable current for fast/coarse or precise milling • automatic FIB source management and reheat routines • milling step of at least 5 nm in serial-section milling applications • two gas injection systems: platinum and carbon • computer(s), monitor(s) and software for the operation of the microscope: — to acquire large image rasters of a single field of view — automated 2D montaging and stitching — automated serial FIB milling and block face imaging of plastic embedded samples for volumeEM — correlation with light microscopy and other imaging modalities. (Software that requires computational time should be provided as both online and offline versions.) • Application Programming Interface (API) to control the microscope using Python scripting • Side offers must be itemized separately and may include UPS, additional holders or detectors, micromanipulator and software for lamella preparation, software for array tomography, or any other beneficial appliances such as air compressor and separate cooling units.