Supply and Installation of a Transmission Electron Microscope (ESIF Funded)

Tender description

Supply and Installation of a Transmission Electron Microscope (ESIF Funded) The University of Birmingham invites tenders for supply of the following equipment to enhance capability needed to support local SMEs in the Midlands. A TEM for advanced materials characterisation General characteristics A TEM, optimised for in-situ characterisation of advanced materials including (but not limited to) engineering alloys for nuclear, aerospace and structural applications, is required. Combined with excellent performance the system should also be compatible with a multi-user environment and be versatile to perform the tasks to a high standard in a time efficient manner. Specifications 1) A TEM capable of diffraction contrast imaging and selected area diffraction and convergent beam diffraction. 2) The maximum beam voltage should be as high as possible and equal to or greater than 300kV. 3) The ability of the microscope to operate in scanning (STEM) mode is highly desirable. 4) The camera should be as many pixels as possible, at least 2k x 2k. The camera should be as high speed as possible. 5) A high energy resolution x-ray SDD is highly desirable. 6) The microscope should be equipped with double tilt low background and single tilt holders. These should be capable of at least ?30? rotation about two perpendicular axes. 7) Specimen drift should be as low as possible.