Laboratory, optical and precision equipments (excl. glasses)

Tender description

The equipment required: Elevated Temperature Nanoindenter — A nanoindenter capable of working at elevated temperature and in controlled environments. Scanning Electron Microscope/Focused Ion Beam Stage Nanoindenter — A nanoindenter and allied nanomechanical characterisation equipment to be mounted in the vacuum chamber of a focused ion beam milling (FIB) scanning electron microscope (SEM) system. X-Ray Microtomography Stage Nanoindenter — A nanoindenter and allied nanomechanical characterisation equipment to be mounted on a high spatial resolution X-Ray Microtomography (XT) equipment. The Materials Research Centre at the College of Engineering of Swansea University specialises in the characterisation of a large range of materials with a particular emphasis placed on structure-property relationships, and close relationships with industrial partners. The purchase of both standalone and in-situ nanomechanical characterisation equipment will widen the scope for researchers to asion sess the nanomechanical properties of a wide range of materials, from soft biomaterials to hard, dense materials such as nickel superalloys. This equipment will support over 100 separate academic/industrial projects funded through the Materials and Manufacturing Academy (M2A) at Swansea University, funded via WEFO. The University wishes to purchase a suite of nanomechanical testing equipment to allow the testing of very small volumes of materials in a range of environments. The equipment required: Elevated Temperature Nanoindenter — A nanoindenter capable of working at elevated temperature and in controlled environments. Scanning Electron Microscope/Focused Ion Beam Stage Nanoindenter — A nanoindenter and allied nanomechanical characterisation equipment to be mounted in the vacuum chamber of a focused ion beam milling (FIB) scanning electron microscope (SEM) system. X-Ray Microtomography Stage Nanoindenter — A nanoindenter and allied nanomechanical characterisation equipment to be mounted on a high spatial resolution X-Ray Microtomography (XT) equipment.