200/YE Ion Beam Facility

Tender description

The University of Sheffield is out to tender on behalf of the Department of Materials Science and Engineering for a Focused ion beam Facility. We seek to purchase a Dual Beam Focused Ion Beam –Scanning Electron Microscope instrument. The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings. The instrument will be used for: a) The ultra-high resolution investigation of the surfaces of materials using both secondary electron (ISE and ESE) and back scattered electron signals. b) The ability to examine material structure with minimal electron beam damage. c) The preparation of the highest quality samples for transmission electron microscopy with the ability to undertake high resolution TEM without further sample preparation. d) To undertake STEM experiments directly in the instrument. e) To undertake dynamic nanoscale experiments within the microscope. f) To be able to lithographically ion mill surface structures such as nano-pillars etc. g) To have the option of undertaking several different analytical techniques in the microscope. h) To enable the investigation of 3D materials volumes through iterative cutting and imaging of sample surfaces. For the purposes of this procurement our requirements have been divided into 3 lots as follows:- Lot 1 – Focused Ion Beam Scanning Electron Microscope (FIB SEM) system. Lot 2 – Cooling system for FIB SEM. Lot 3 – Energy Dispersive spectroscopy system for FIB SEM. Suppliers are welcome to tender for one, two or all Lots. The closing date for return of tenders is Friday 10th July 2015 at 12 noon (UK time) Suppliers must register on the University's e-tendering portal in order to access the tender documents and submit their responses. https://www.in-tendhost.co.uk/sheffield