Semiconductor Lifetest Equipment

Tender description

NPL and the University of Glasgow will work together to establish a service for Burn-in and Life-testing of semiconductor laser diodes in high-volume for manufacturers and suppliers of laser diodes. The requirements for such a system are as follows: Essential: • TO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month • Life-test duration > 10,000 hours • Burn in / Life-test temperature from Ambient to 150degC with independent heaters in each module • Maximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC) • Bar test – Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across. All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test. • Optical detector to monitor light output of each device under test • Wavelength range from 400 nm – 1600 nm • Temperature sensor at each device for close monitoring • Independent current drive for each device • Adaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future “non-standard” testing requests • Low noise, highly stable current driver for each device (<0.1mA RMS noise) • Stable temperature during life-test (no variation > 1degC) • Remote access to monitor and control system software Lot 1: The requirements for such a system are as follows: Essential: • TO46, TO3, TO5, TO8, TO9 package compatibility in volumes up to 200 per month for burn-in and 100 devices for life-test per month • Life-test duration > 10,000 hours • Burn in / Life-test temperature from Ambient to 150degC with independent heaters in each module • Maximum bias up to 1A on TO3 and TO8 package, and Chip-on-carrier (CoC) • Bar test – Typical bar with dimensions 30 mm long and up to 10 mm wide, with 100 devices across. All the devices on the bar will require burn-in. At least 10 devices on each bar will need life-test. • Optical detector to monitor light output of each device under test • Wavelength range from 400 nm – 1600 nm • Temperature sensor at each device for close monitoring • Independent current drive for each device • Adaptable/re-configurable bar-test, CoC layout and # of pins on TO-packages for future “non-standard” testing requests • Low noise, highly stable current driver for each device (<0.1mA RMS noise) • Stable temperature during life-test (no variation > 1degC) • Remote access to monitor and control system software