ITT - Research Scanning Electron Microscope

Tender description

The National Physical Laboratory [NPL] requirement is for a Scanning Electron Microscope suitable for high resolution micro-structural characterisation of a wide range of samples. Imaging capabilities should encompass ultra-high resolution of biological nanoparticles with dimensions of 10 nm through to image acquisition of regions > 10 mm in size through stitching of multiple images. Conductive and non-conductive samples will require to be imaged and methods for charge dissipation without significant loss of resolution will be required. The microscope is also required to be suitable for analytical measurements by Energy Dispersive X-ray Spectroscopy (EDX) and Electron Backscatter Diffraction (EBSD). Detectors for these methods should be supplied as an integrated solution and the system must be capable of high beam current densities to enable these detectors to run at their highest possible rates whilst also maintaining capabilities for high resolution imaging with low beam currents. It is also intended to use the microscope for in situ micromechanical testing, so the specification also includes the provision of a mechanical test stage suitable for testing of mm scale test samples, including heating to high temperatures. Lot 1: The National Physical Laboratory [NPL] requirement is for a Scanning Electron Microscope suitable for high resolution micro-structural characterisation of a wide range of samples. Imaging capabilities should encompass ultra-high resolution of biological nanoparticles with dimensions of 10 nm through to image acquisition of regions > 10 mm in size through stitching of multiple images. Conductive and non-conductive samples will require to be imaged and methods for charge dissipation without significant loss of resolution will be required. The microscope is also required to be suitable for analytical measurements by Energy Dispersive X-ray Spectroscopy (EDX) and Electron Backscatter Diffraction (EBSD). Detectors for these methods should be supplied as an integrated solution and the system must be capable of high beam current densities to enable these detectors to run at their highest possible rates whilst also maintaining capabilities for high resolution imaging with low beam currents. It is also intended to use the microscope for in situ micromechanical testing, so the specification also includes the provision of a mechanical test stage suitable for testing of mm scale test samples, including heating to high temperatures.