NMS - Variable Pressure Field Emission Gun Scanning Electron Microscope with Analytical Detectors & Specimen Coater

Tender description

This tender seeks to procure a Variable Pressure Field-Emission Gun Scanning Electron Microscope (VP FEG-SEM) and a range of analytical detectors (CL, EDX, WDS, EBDSD) and specimen coater (C/Pt) to enable high-resolution imaging and analysis which can be used in concert at the National Museums Collection Centre in Edinburgh to study a wide range of collections. Lot 1: VARIABLE PRESSURE FIELD-EMISSION GUN SEM (VP FEG-SEM) Please see attached tender documentation for full details. Additional information: Please see the tender documents uploaded to this notice for full details. Lot 2: RGB/COLOUR CATHODOLUMINESCENCE DETECTOR (CL) Please see attached tender documentation for full details. Additional information: Please see the tender documents uploaded to this notice for full details. Lot 3: A) TRANSFER OF EXISTING EDX SYSTEM & SOFTWARE UPGRADE; OR B) A NEW EDX SYSTEM; AS WELL AS A WAVELENGTH DISPERSIVE X-RAY SPECTROMETER AND ELECTRON BACKSCATTER DIFFRACTION MICROANALYSIS SYSTEM Please see attached tender documentation for full details. Additional information: Please see tender documents attached to this notice for full details. Lot 4: SPECIMEN COATER (C/Pt) Please see attached tender documentation for full details. Additional information: Please see tender documents uploaded to this notice for full details. Lot 1: VARIABLE PRESSURE FIELD-EMISSION GUN SEM (VP FEG-SEM) Please see attached tender documentation for full details. Additional information: Please see the tender documents uploaded to this notice for full details. Lot 2: RGB/COLOUR CATHODOLUMINESCENCE DETECTOR (CL) Please see attached tender documentation for full details. Additional information: Please see the tender documents uploaded to this notice for full details. Lot 3: A) TRANSFER OF EXISTING EDX SYSTEM & SOFTWARE UPGRADE; OR B) A NEW EDX SYSTEM; AS WELL AS A WAVELENGTH DISPERSIVE X-RAY SPECTROMETER AND ELECTRON BACKSCATTER DIFFRACTION MICROANALYSIS SYSTEM Please see attached tender documentation for full details. Additional information: Please see tender documents attached to this notice for full details. Lot 4: SPECIMEN COATER (C/Pt) Please see attached tender documentation for full details. Additional information: Please see tender documents uploaded to this notice for full details.