X-ray devices

Tender description

For routine characterization of MBE-grown thin films of transition metal oxides and dichalcogenides, we require an X-ray system for high-resolution X-ray diffraction which fulfills the following requirements. The instrument will be used to characterize crystallographic structure, composition, thickness, strain/relaxation and quality of thin films and heterostructures of transition metal oxides and chalcogenides as well as of single crystals, organic thin films and others. For routine characterization of MBE-grown thin films of transition metal oxides and dichalcogenides, we require an X-ray system for high-resolution X-ray diffraction which fulfills the following requirements. The instrument will be used to characterize crystallographic structure, composition, thickness, strain/relaxation and quality of thin films and heterostructures of transition metal oxides and chalcogenides as well as of single crystals, organic thin films and others.