Diffraction apparatus

Tender description

We require an X-ray diffraction instrument for the Department of Materials X-ray characterization laboratory. We intend to use this diffractometer to characterise polycrystalline and powder samples from a range of research fields. It will be replacing existing specialist equipment optimised to measure in grazing incidence modes to bias the signal from the sample to the top surface layers. The region of interest in the surface layer may have only a few microns of depth or several hundred microns depending on the research field, GO films vs. thermal barrier coatings. We will use the diffractometer in reflection geometry with the 1D or equivalent detector, in order to characterise the ‘surface’ in terms of: 1) Phases present and potential amorphous fractions; 2) Simple texture; 3) Lattice strains and lattice constants; 4) Structural refinement. This instrument should allow us to combine in a single experimental batch, depending on the sample characteristics, (1) standard 1D powder dif We require an X-ray diffraction instrument for the Department of Materials X-ray characterization laboratory. We intend to use this diffractometer to characterise polycrystalline and powder samples from a range of research fields. It will be replacing existing specialist equipment optimised to measure in grazing incidence modes to bias the signal from the sample to the top surface layers. The region of interest in the surface layer may have only a few microns of depth or several hundred microns depending on the research field, GO films vs. thermal barrier coatings. We will use the diffractometer in reflection geometry with the 1D or equivalent detector, in order to characterise the ‘surface’ in terms of: 1) Phases present and potential amorphous fractions; 2) Simple texture; 3) Lattice strains and lattice constants; 4) Structural refinement. This instrument should allow us to combine in a single experimental batch, depending on the sample characteristics: 1) Standard 1D powder diffraction with; 2) Grazing incidence (GIXRD) to increase the sensitivity to the surface layer; 3) Simple texture measurement, by rotation of Phi at set intervals during either (1) or (2) and Ω scans. This system must also accommodate a variable temperature measurement capability and large single sample position.