I06 Aberration Corrected PEEM/LEEM Microscope

Tender description

Our technical specification details the requirements of the Aberration Corrected PhotoEmission Electron Microscope (AC-PEEM) and Low Energy Electron Microscope (AC-LEEM) for use on the Nanoscience beamline at DLS. The microscope will be installed on the nanoscience I06 beamline that is dedicated to the study of nanomagnetism and nanostructures using element specific probes such as X-Ray absorption spectroscopy and X-Ray photoelectron spectroscopy. The variable polarisation state of the x-ray light provides a contrast mechanism for imaging different magnetisation states in ferromagnetic and anti-ferromagnetic nanostructures. The contractor will be responsible for the supply of materials, manufacture, inspection, cleaning, testing, vacuum baking, assembly, packing, delivery and installation at DLS of the AC-PEEM/LEEM complete microscope.