Cryogenic focused ion beam field emission gun scanning electron microscope & confocal laser scanning light microscope

Tender description

Cryogenic, focused ion beam (FIB), field emission gun (FEG), scanning electron microscope (SEM) (CryoFIB-FEGSEM), flexibly configured to enable the controlled sectioning and transfer, high-resolution 3D imaging and chemical mapping of a wide range of soft, delicate, organic, hydrated and temperature sensitive materials, all under near liquid nitrogen conditions (aka \"High Resolution, Cryogenic Analytical and Transfer SEM\" (HR-CAT-SEM)) (LOT1). In addition, we invite tenders for a complementary, high-end, confocal laser scanning light microscope (CLSM), with region of interest (ROI) identification capabilities, through the use of optical trapping and laser branding, for multi-scale sample location and analysis (LOT2)