Microscopes

Tender description

Our technical specification details the requirements of the Aberration Corrected PhotoEmission Electron Microscope (AC-PEEM) and Low Energy Electron Microscope (AC-LEEM) for use on the Nanoscience beamline at DLS. The microscope will be installed on the nanoscience I06 beamline that is dedicated to the study of nanomagnetism and nanostructures using element specific probes such as X-Ray absorption spectroscopy and X-Ray photoelectron spectroscopy. The variable polarisation state of the x-ray light provides a contrast mechanism for imaging different magnetisation states in ferromagnetic and anti-ferromagnetic nanostructures. The contractor will be responsible for the supply of materials, manufacture, inspection, cleaning, testing, vacuum baking, assembly, packing, delivery and installation at DLS of the AC-PEEM/LEEM complete microscope. The system and scope of supply should principally consist of the AC-PEEM Microscope system including the following sub systems: 1) AC-PEEM; (a) electron optics; (b) aberration corrector; (c) imaging energy filter; (d) electron Gun for LEEM. 2) Sample manipulator. 3) Sample holder and cartridges with electrical contacts. 4) Heating and temperature controllers for samples. 5) Sample chamber. 6) Load lock and sample storage. 7) Transfer port to a preparation chamber. 8) UV lamp. 9) Vacuum system. 10) Control electronics including: (a) cabling and connections to DLS services; (b) racks for the microscope high voltage electrostactic and magnetic lenses. 11) Control software (see Section 6.3). 12) Installation and commissioning of the system at DLS, as specified in Section 10. 13) Option of sufficient spare parts with long delivery times to guarantee operation of the system with minimum down-time for a period of at least 2 years from the date of the final acceptance.