Laboratory, optical and precision equipments (excl. glasses)

Tender description

Atomic Force Microscopy (AFM) is a surface profiling technique which allows the topography of nanostructured surfaces to be mapped. Primarily AFMs are used for surface profiling and particle sizing however a series of secondary modes can provide maps of electrical conductivity, surface potentials and mechanical properties. As such a large sample area AFM will form an important characterization tool for the CPI's graphene centre where materials lateral dimensions and height must be measured independently. In addition the AFM will also support the characterization of spherical particles, conductive inks and vapour deposited films. The AFM will be used primarily for particle sizing and surface topography. However it will also be used to measure the conductivity of poorly conducting inks, surface potentials of vapour deposited films, and the mechanical properties of polymer composites. Atomic Force Microscopy (AFM) is a surface profiling technique which allows the topography of nanostructured surfaces to be mapped. Primarily AFMs are used for surface profiling and particle sizing however a series of secondary modes can provide maps of electrical conductivity, surface potentials and mechanical properties. As such a large sample area AFM will form an important characterization tool for the CPI's graphene centre where materials lateral dimensions and height must be measured independently. In addition the AFM will also support the characterization of spherical particles, conductive inks and vapour deposited films. The AFM will be used primarily for particle sizing and surface topography. However it will also be used to measure the conductivity of poorly conducting inks, surface potentials of vapour deposited films, and the mechanical properties of polymer composites.