Microscopes

Tender description

Dear Suppliers, An Atomic force microscope (AFM) capable of performing rapid 2D and 3D imaging of a sample area is required. The instrument should have scanning and analysis options, reduced noise and sample analysis capabilities as laid out in the requirements tables of the attached documents. This instrument will be used for topological characterization of a variety of biomaterials; primarily DNA nanostructure but also DNA-protein structures, proteins and RNA nanostructures. The instrument should allow for the rapid taking of large amounts of data (large scan areas at high resolution) as well as detailed characterisation of nanostructures. Dear Suppliers, An Atomic Force Microscope (AFM) capable of performing rapid 2D and 3D imaging of a sample area is required The instrument should have scanning and analysis options, reduced noise and sample analysis capabilities as laid out in the requirements tables of the attached documents. This instrument will be used for topological characterization of a variety of biomaterials; primarily DNA nanostructure but also DNA-protein structures, proteins and RNA nanostructures. The instrument should allow for the rapid taking of large amounts of data (large scan areas at high resolution) as well as detailed characterisation of nanostructures.