Laboratory, optical and precision equipments (excl. glasses)

Tender description

The University of Birmingham invites tenders for supply of the following equipment to enhance the capability in advanced materials characterisation. Tenders may be submitted for the provision of all (6 lots) of the equipment outlined below, or for parts thereof. Each tenderer may propose more than one option in response to this invite. Specifications 1) Electron column and electron beam detector options; — A FEG SEM column is required with a voltage range of at least from 30 kV to 0.5 kV. The resolutions of the column should be given at least at 30 kV [1 nm] and 3 kV [3 nm] expected guide values are in parenthesis. Please state whether the system contains an immersion mode and if so whether it is possible to analyse magnetic samples in this mode. If not please quote the resolutions attainable in the non-immersion mode. — The system must have a minimum current of 20 nA at 20 kV and ideally be continuously adjustable. — The system should allow automated image collection including auto focus and stigmation. — The system must have a solid-state backscatter detector allowing low kV (< 3 kV) imaging. This detector must be retractable and have safeguards against incorrected insertion. The park position should also be safe from contact with large samples. — The system must contain a minimum of a standard Everhart Thornley detector, In-lens SE and BS detectors, and a STEM detector. 2) Ion column and detectors for imaging with the ion beam — The system must possess an ion column with an attainable resolution of at least 7 nm. — An ion beam current >50 nA is desirable — please state the standard currents available and their probe sizes. — The ability of the column to operate at low kV to remove sample damage is also desirable. — The system must possess a secondary ion detector and state whether this detector degrades with time. Ion-induced secondary electrons must also be able to be imaged. 3) Gas injection systems. The system must contain a multiple gas injection system that allows Pt and C gases to be deposited. It is highly desirable that the Pt and C can be deposited by the electron beam at zero tilt without risk of collision. The ability to accommodate more gases is also desirable. 4) Micromanipulator. A micromanipulator for a wide variety of sample preparation types (TEM sample preparation, atom probe, X-ray tomography) is required. It is desirable to have a very high accuracy probe, simple (in-situ) tip change procedure and concentric rotation capability however since the budget for this project is tight, a compromise is possible here. Where different options are available you are welcome to provide them so that we can decide whether the increased capability justifies the extra costs. 5) Nano-machining — The ability to cut with the FIB a variety of user define shapes in a simple user defined manner is required. The ability to monitor patterning in real time using both the ion and electron beams in an integrated manner is also required. Please state the capabilities of the system for nano-patterning and real time imaging. 6) 3D analysis –3D analysis capability is required from multiple signals; including SE, In-lens SE and BS and EBSD/EDS. It is desirable to be able to do 3D analysis using other signals such as solid- state BS, SIMS, ion beam images. The ability to record electron beam images during cutting processes is also required. Please also state any 3D analysis software that comes with the system. 7) The system should also be configured for 3D EBSD/EDS. It is desirable to be able to undertake 3D EBSD/EDS simultaneously. Please state whether stage rotation is needed to move between the ion beam milling and EBSD collection positions. 8) Sample navigation. The sample should allow easy navigation of large samples. 9) Stage — A stage that allows maximum flexibility to the operation of the system and the samples that are examined is sought. Please can you specify the following parameters; the values in parenthesis are values that are expected as a guideline. — Movement ranges; x,y and z and tilt [150 mm, y = 150 mm, z = 100 mm and 90°] — Maximum sample size and weight (W) [x= 150 mm, y = 150 mm, z = 100 mm, W > 1 kg] — Repositioning accuracy [1 µm] — Pumping time from the main door [maximum 5 mins]. An in-situ mechanical testing system is required for the evaluation of performance of advanced engineering alloys. The system needs to combine ease of use with functionality and be able to offer load/displacement results with high resolution. Specifications: 1) Loading capability: the maximum load should be of 100 mN or above; the typical load noise background must be less than 4 uN; 2) Displacement: the maximum displacement should be of 35 um or above; the displacement resolution of 2 nm or better; 3) It is highly desirable to have the high temperature mechanical testing capability at 400 oC or above. Suppliers are requested to state the heating/cooling rates, the accuracy of the temperature control, the stability of the temperature and the resolution (both load and displacement) at these temperatures; details of grips or indenter tips included for high temperature tests; Ideally the grips and the indenter need to be actively heated; the number of special grips or tips included should be stated; 4) Dynamic mechanical testing capability is highly desirable. Details such as the information of the frequency, load/displacement, duration suitable for the dynamic tests should be included. 5) Supplier to state what grip, indenter tips and standard samples are included and the options of any extra grips, indenter tips and standard samples; 6) It is desirable to have the sample stage tilting/rotation capability. When such a stage is included the suppliers are requested to include the technical details of the stage and the tilting/rotation resolution and limits. 7) Control system: supplier to specify the software and the hardware and the drivers for any devices. It is highly desirable that a license of the software for off-line analysis be included; 8) Any options that suppliers can offer within the budget to complement and augment our current small-scale mechanical testing capability are highly desirable.