Closed tender

Scanning electron microscopes

Details

Topic
Scanning electron microscopes
Published
24 July 2017
Submission
31 August 2017

Tender description

A high resolution scanning electron microscope (SEM) is required for the nanoscale analysis and imaging of III-V compound semiconductor samples. Tenders will only be considered for complete systems comprising Imaging microscope, control software, image capture software and (Specified) EDX detector and associated software. A high resolution scanning electron microscope (SEM) is required for the nanoscale analysis and imaging of III-V compound semiconductor samples. Tenders will only be considered for complete systems comprising Imaging microscope, control software, image capture software and (Specified) EDX detector and associated software.

Timeline

  1. Completed: Tender published24 July 2017
    Current notice
  2. Completed: Submission date31 August 2017

About the buyer

Cardiff University is a public sector buyer in United Kingdom publishing tenders and awards on Stotles. Explore their procurement activity and find more opportunities like this one.

Relevant CPV codes

  • 38511100 · Scanning electron microscopes

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