MINI TENDER FOR THE SUPPLY OF EDS AND EBSD SYSTEMS TO FIT ONTO A PLASMA-FIB/SEM

Tender description

This is not a full OJEU process. The University has opted to publish this requirement for 15 - 20 days only , however, a full OJEU tender will not be undertaken. Specifications: 1. An energy dispersive X-ray spectrometer (EDS) with large area (>60 mm2) silicon drift detectors (SDD) for chemical analysis is requested. The EDS system must be able to perform spot analysis, linescan and mapping, as well as be able to carry out peak identification and quantification functions in the software. It is highly desirable that the quantification function can be performed in spot analysis, linescan and mapping mode. Suppliers are requested to state the energy resolution (better than 129 eV) and the typical solid angle under specified typical operation conditions of the EDS system. 2. An electron backscattered diffraction (EBSD) system is requested. Supplier to specify the speed and angular resolution of the system and the number of diode detectors included. 3. It is highly desirable that the system can be used to map (for both EDS and EBSD) large area samples quantitatively and via automated specimen movement. 4. Software: any options available but not included in the budget need to be stated and their cost itemized. 5. Suppliers are requested to clarify the compliance of their products with the microscope. 6. It is desirable to be able to undertake 3D EBSD/EDS simultaneously. Please state whether stage rotation is needed between the ion beam milling and EBSD collection positions. Please also state any 3D analysis software that comes with the system. 7. Any other functionality available should be stated.