Laboratory, optical and precision equipments (excl. glasses)

Tender description

Tenders for the supply of the following equipment to enhance the capability in advanced materials characterisation. Tenders may be submitted for the provision of all (6 lots) of the equipment outlined below, or for parts thereof. Each tenderer may propose more than one option in response to this invite. Lot 1 — Analytical FEG SEM. General characteristics. A FEG-SEM which combines the best possible analytical performance with state-of-the art imaging performance on advanced materials (including engineering alloys and nanostructure materials) is required. Combined with excellent performance the system should also be compatible with a multi-user environment and be versatile to perform many tasks to a high standard in a time efficient manner. Specifications. 1) Electron column characteristics — A field emission source with a secondary electron imaging resolution of 1 nm or less at high accelerating voltages (>15 kV) and less than 3 nm at 1 kV. 2) Detectors for both secondary and backscattered electrons, In-lens detectors capable of electron signal separation, and a STEM detector. The solid-state backscatter detector should have high sensitivity enabling it work at low voltages (< 3 kV). 3) Low landing voltage imaging using the beam deceleration technology. 4) Ideally with an in-situ sample/chamber cleaning device such as the plasma cleaner. 5) Suitable for imaging a wide range of samples which will include magnetic, non-conductive and beam sensitive materials. 6) Ability to automate image collection to produce high resolution image montages. 7) Able to accommodate large samples (approx. 150 mm x 150 mm x 50 mm) and navigate around these samples with ease. 8) It is desirable to have a time-efficient sample transfer system — if load lock is included please specify the sample sizes that can be transferred, and please also state the pump times when opening the chamber door. 9) It is desirable for the system to be compatible with vacuum transfer devices for air sensitive samples. 10) The specimen chamber size should be as larger as possible. Lot 2. SEM/FIB Dual-beam microscope. General Characteristics. A multi-functional fully integrated SEM/FIB hybrid is required for various forms of 3D analysis, sample preparation, imaging, nano-machining and chemical analysis. The system needs to combine ease of use with functionality and also suitable for in-situ experiments such as heating and straining. Specifications. 1) Electron column and electron beam detector options: — A FEG SEM column is required with a voltage range of at least from 30 kV to 0.5 kV. The resolutions of the column should be given at least at 30 kV [1 nm] and 3 kV [3 nm] expected guide values are in parenthesis. Please state whether the system contains an immersion mode and if so whether it is possible to analyse magnetic samples in this mode. If not please quote the resolutions attainable in the non-immersion mode. — The system must have a minimum current of 20 nA at 20 kV and ideally be continuously adjustable. — The system should allow automated image collection including auto focus and stigmation. — The system must have a solid-state backscatter detector allowing low kV (< 3 kV) imaging. This detector must be retractable and have safeguards against incorrected insertion. The park position should also be safe from contact with large samples. — The system must contain a minimum of a standard Everhart Thornley detector, In-lens SE and BS detectors, and a STEM detector. 2) Ion column and detectors for imaging with the ion beam: — The system must possess an ion column with an attainable resolution of at least 7 nm. — An ion beam current >50 nA is desirable — please state the standard currents available and their probe sizes. — The ability of the column to operate at low kV to remove sample damage is also desirable. — The system must possess a secondary ion detector and state whether this detector degrades with time. Ion-induced secondary electrons must also be able to be imaged. 3) Gas injection systems. The system must contain a multiple gas injection system that allows Pt and C gases to be deposited. It is highly desirable that the Pt and C can be deposited by the electron beam at zero tilt without risk of collision. The ability to accommodate more gases is also desirable. 4) Micromanipulator. A micromanipulator for a wide variety of sample preparation types (TEM sample preparation, atom probe, X-ray tomography) is required. It is desirable to have a very high accuracy probe, simple (in-situ) tip change procedure and concentric rotation capability however since the budget for this project is tight, a compromise is possible here. Where different options are available you are welcome to provide them so that we can decide whether the increased capability justifies the extra costs. 5) Nano-machining — The ability to cut with the FIB a variety of user define shapes in a simple user defined manner is required. The ability to monitor patterning in real time using both the ion and electron beams in an integrated manner is also required. Please state the capabilities of the system for nano-patterning and real time imaging. 6) 3D analysis –3D analysis capability is required from multiple signals; including SE, In-lens SE and BS and EBSD/EDS. It is desirable to be able to do 3D analysis using other signals such as solid- state BS, SIMS, ion beam images. The ability to record electron beam images during cutting processes is also required. Please also state any 3D analysis software that comes with the system. 7) The system should also be configured for 3D EBSD/EDS. It is desirable to be able to undertake 3D EBSD/EDS simultaneously. Please state whether stage rotation is needed to move between the ion beam milling and EBSD collection positions. 8) Sample navigation. The sample should allow easy navigation of large samples. 9) Stage — A stage that allows maximum flexibility to the operation of the system and the samples that are examined is sought. Please can you specify the following parameters; the values in parenthesis are values that are expected as a guideline. — Movement ranges; x,y and z and tilt [150 mm, y = 150 mm, z = 100 mm and 90°]. — Maximum sample size and weight (W) [x= 150 mm, y = 150 mm, z = 100 mm, W > 1 kg]. — Repositioning accuracy [1 µm]. — Pumping time from the main door [maximum 5 mins]. — If the system proposed comes with a load lock please specify the total sample exchange time and the size of sample that can be inserted this way. — The ability to integrate with a vacuum transfer device is highly desirable. If this is possible please describe which systems this is compatible with and their costs as an option. — Please also quote for a plasma cleaner as an option, whether this is needed depends on other parts of the system configuration and the overall cost. 10) An uninterruptable power supply (UPS) system to mitigate against power cuts must be supplied. The UPS system should prioritise protection of the field emission gun and allow safe shutdown of the equipment after a specified period. 11) System maintenance and uptime. Please state the approx. number of hours that the ion beam source will last and what the typical time between reporting a depleted source and having the system running again is. Since maximum uptime in the system is required are there procedures in place to train users to replace their own ion beam sources and apertures. Can the ion beam apertures be changed individually or does the whole strip need replacing? Please highlight any other similar operational considerations. Lot 3. Analytical attachments to be fitted onto the systems listed in Lot 1 and Lot 2. General Characteristics. EDS and EBSD systems are requested as the analytical tools to fit onto the microscopes listed in Lot 1 and Lot 2 above. Specifications: 1. Energy dispersive X-ray spectrometers (EDS) with large area (>60 mm2) silicon drift detectors (SDD) for chemical analysis are requested. The EDS system must be able to perform spot analysis, linescan and mapping, as well as be able to carry out peak identification and quantification functions in the software. It is highly desirable that the quantification function can be performed at spot analysis, linescan and mapping mode. Suppliers are requested to state the energy resolution, typical solid angle under specified typical operation conditions of the EDS system. 2. Electron backscattered diffraction (EBSD) system is requested. Supplier to specify the speed and angular resolution of the system and the number of diode detectors included. 3. It is highly desirable that the system can be used to map (for both EDS and EBSD) large area samples quantitatively. 4. Software: any options available but not included in the budget need to be stated and their cost itemized. 5. Suppliers are requested to clarify the compliance of their products with the microscope models. Lot 4. Light element detection device. Device for light element (including lithium) detection is requested to fit onto the system requested in Lot 1 or Lot 2. Supplier to state the chemical detection limit; its sensitivity (at least comparable to WDS) and the operation pre-caution needed. Lot 5. In-situ mechanical testing device. General Characteristics. An in-situ mechanical testing system is required for the evaluation of performance of advanced engineering alloys. The system needs to combine ease of use with functionality and be able to offer load/displacement results with high resolution. Specifications: 1) Loading capability: the maximum load should be of 100 mN or above; the typical load noise background must be less than 4 uN; 2) Displacement: the maximum displacement should be of 35 um or above; the displacement resolution of 2 nm or better; 3) It is highly desirable to have the high temperature mechanical testing capability at 400 oC or above. Suppliers are requested to state the heating/cooling rates, the accuracy of the temperature control, the stability of the temperature and the resolution (both load and displacement) at these temperatures; details of grips or indenter tips included for high temperature tests; Ideally the grips and the indenter need to be actively heated; the number of special grips or tips included should be stated; 4) Dynamic mechanical testing capability is highly desirable. Details such as the information of the frequency, load/displacement, duration suitable for the dynamic tests should be included. 5) Supplier to state what grip, indenter tips and standard samples are included and the options of any extra grips, indenter tips and standard samples; 6) It is desirable to have the sample stage tilting/rotation capability. When such a stage is included the suppliers are requested to include the technical details of the stage and the tilting/rotation resolution and limits. 7) Control system: supplier to specify the software and the hardware and the drivers for any devices. It is highly desirable that a license of the software for off-line analysis be included; 8) Any options that suppliers can offer within the budget to complement and augment our current small-scale mechanical testing capability are highly desirable. Lot 6. In-situ heating holder. General Characteristics. An in-situ heating holder is required for microstructural observation of the engineering alloys in electron microscopes. The system needs to combine the ease of use with functionality and be able to offer high thermal stability for imaging and microanalysis. Specifications: 1) Be able to heat a sample up to at least 800 °C, ideally up to 1300 °C while maintaining reliable temperature accuracy (< 5 % accuracy); 2) Less than 1 °C fluctuation of the sample temperature at any set temperature; 3) Suppliers are requested to specify the heating rate achievable and the typical sample drift at different set temperatures and the maximum cooling rate achievable; 4) Suppliers are requested to clarify the suitability of the holder for X-ray microanalysis; 5) Any consumables needed for sample preparation must be clarified and the costs for these consumables stated; 6) Suppliers are requested to state the tilting/rotation capability of the holder; 7) Suppliers are requested to clarify if simultaneous heating and tilting/rotation are possible; 8) Suppliers are requested to clarify the microscope compatibility of the holder.