Ion Beam Facility

Tender description

This contract is a one-off supply only and has now been awarded. Dual Beam Focused Ion Beam –Scanning Electron Microscope instrument. The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings. For the purposes of this procurement our requirements have been divided into 3 lots as follows:- Lot 1 – Focused Ion Beam Scanning Electron Microscope (FIB SEM) system. Lot 2 – Cooling system for FIB SEM. Lot 3 – Energy Dispersive spectroscopy system for FIB SEM.