112/YE Ion Beam Microscope
Details
- Published
- 21 December 2006
- Source
- uk:sheffielduniversity
Tender description
Tender supply, installation and commissioning of an dual beam focused Ion Beam Microscope that is capable of both scanning electron microscopy and focused ion beam milling with in-situ TEM sample preparation, required by the Department of Engineering Materials. <br /><br />Further details are available in the tender documents.<br /><br />Closing date for return of tenders: 30th January 2007 at 12 noon (GMT).<br /><br />PLEASE NOTE: There is an administration charge of £100 for the issue of Tender documents. There is no charge for Expressions of Interest in order to view the tender specification, but suppliers who submit tender offers will be invoiced after the tender closing date.
Timeline
- Completed: Tender published21 December 2006Current notice
About the buyer
University of Sheffield is a public sector buyer in United Kingdom publishing tenders and awards on Stotles. Explore their procurement activity and find more opportunities like this one.
Decision makers
Connect with the people behind this procurement.
| Contact name | Job title | Phone number | Work email |
|---|---|---|---|
| Head of Procurement | +44 •••• •••••• | ••••••••@university-of-sheffield.gov | |
| Commercial Director | +44 •••• •••••• | ••••••••@university-of-sheffield.gov | |
| Procurement Manager | +44 •••• •••••• | ••••••••@university-of-sheffield.gov | |
| Category Lead | +44 •••• •••••• | ••••••••@university-of-sheffield.gov | |
| Senior Buyer | +44 •••• •••••• | ••••••••@university-of-sheffield.gov | |
| Contracts Manager | +44 •••• •••••• | ••••••••@university-of-sheffield.gov |
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